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X射线衍射测定聚烯烃催化剂载体硅胶平均晶粒尺寸
Determination of average crystallite sizes of silica gel for polyolefin catalyst carriers by benchtop X-ray diffractometer
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- DOI:
- 作者:
- 郑 鑫，孟智超，李晓璐，杜亚明
Zheng Xin, Meng Zhichao, Li Xiaolu, Du Yaming
- 作者单位:
- 苏州浪声科学仪器有限公司，江苏 苏州 215151
LANScientific Co., Ltd., Suzhou 215151, China
- 关键词:
- ：硅胶；纳米晶粒；平均晶粒尺寸测试；载体；催化剂；聚烯烃；谢勒公式； X-射线衍射；桌面式专用X-射线衍射仪
Silica Gel; Nanocrystalline; Average Crystallite Size Measurement; Support; Catalyst; Polyolefin; Scherrer Equation; X-ray Diffraction; A Dedicated Benchtop X-ray Diffractometer
- 摘要:
- 摘要：聚烯烃催化剂载体硅胶平均晶粒尺寸是1项极其重要的质量指标。采用桌面式X-射线衍射仪分别对2种进口和2种国产聚烯烃催化剂载体硅胶原始样品及1种进口和1种国产硅胶研磨试样的平均晶粒尺寸进行了分析，测定范围 4.86~5.07 nm，标准偏差（SD 或 σ）0.13~0.26 nm，相对标准偏差（RSD）2.49%~5.32%，极差 0.35~0.89 nm，n=8，能够满足聚烯烃催化剂载体硅胶平均晶粒尺寸分析的所有工艺技术要求。基于该方法，研发了用于聚烯烃催化剂载体硅胶平均晶粒尺寸分析的桌面式专用X-射线衍射仪，可在石化生产行业推广应用。Abstract: The average crystallite size of silica gel for polyolefin catalyst support is a crucial quality specification. The averagecrystallite sizes of two imported and two domestic silica gel carrier samples, as well as one imported and one domestic silica gelgrinding samples, were analyzed by using benchtop X-ray diffractometer. The measurement range was 4.86nm to 5.07nm, with astandard deviation (SD or σ) of 0.13nm to 0.26nm. The relative standard deviation (RSD) was 2.49% to 5.32%, and the range was0.35nm to 0.89nm, n=8, meeting all technical requirements for the analysis of the average crystallite sizes of silica gel for polyolefincatalyst carriers. Based on this method, a dedicated benchtop X-ray diffractometer was developed for measuring the averagecrystallite sizes of silica gel for polyolefin catalyst carriers, which can be widely applied in the petrochemical production industry.Keywords: Silica Gel; Nanocrystalline; Average Crystallite Size Measurement; Support; Catalyst; Polyolefin; Scherrer Equation;